FUTURELED offers a wide and modern measurement technology for electronic, optical and mechanical characterization:
Optoelectronic measurement technology
- In the spectral range from 198 to 1115 nm measurement of the overall radiant flux (luminous flux), the radiant intensity (light intensity) and the frame of the radiant intensity distribution (frame of the light intensity distribution).
- Transmission-, absorption- and reflection-measurements in the spectral range from 200 to 2500 nm.
- Spectrally resolved measurement of the bidirectional scattering function of solid surfaces in the range of 198 and 1115 nm.
- Spectrally resolved overall surface reflectivity characterization in the azimuth and elongation range from -90 to 90° Celsius and a spectral range from 198 to 1115 nm.
- Complete excitation spectroscopy with an excitation wavelength between 200 and 1000 nm and 198 to1115 nm in the emission spectrum with solid and liquid samples.
- Optical and electronic short pulse tests up to 2 ns.
- Measuring stations for automated long-term studies on high- and low-power emitters with up to 1000 components.
Electronical measurement technology
FUTURELED now offers electronical measurements, too:
- Electric characteristic lines in the range from 100fA to 10 A and 100 pV to 400 V with a resolution higher than 1 ppm.
- Electric characteristics of the capacity from 1 pF to 100 F with < 1 %.
- Electric alternating signal in generation and analysis up to 500 MHz.
- Examination of the electromagnetic compatibility.
FUTURELED is now able to enlarge its range of services by adding optical simulation with the ray tracing program light tools.
The main focus is on modeling, simulation and analysis of custom-made layouts (conductor boards, reflectors, casting mould, etc.) – in particular semiconductor chips, light-emitting diodes and LED-modules.
With the help of beam parameters of various manufacturers (OSRAM, Philips) it is possible to include information of products already on the market and to test the influence of customized parameters.
FUTURELED is able to operate thermo simulations for simple and complex systems exemplary and complete in scales from 100 nm to 1000 nm by using the multi-physics-software-package COMSOL on its high-performance computers.
The wide measurement technology allows FUTURELED to refine and cover model data by concrete material characterizations. Resulting from this it is possible to provide customers with extrapolated and reliable results.
LED life time test
The modifications of the emission characteristics are quite relevant to the long-term performance of luminescence and laser diodes.
Generally the intensity of the emission radiation of a luminescence diode - operated under constant conditions – decreases continously.
This performance is defined as aging or degradation. It is still not completely researched but seems to be connected with movement or rather expansion of impurity in the crystal.
An abrupt decrease of the emission of semiconductor light sources – as known from light bulbs – is only observable on a laser diode when the diode is destroyed by an exaggerated threshold current resulting from a chain reaction.
LED and chip selection
Due to its wide variety of advantages the LED is rightly considered as “luminescent substance of the future”. It is used in a large number of applications already. But for many applications (e.g. signal technology an indirect lighting) a pre-selection of colorimetic locus and/or intensity is inevitable in order to guarantee an uniform appearance.